Communication science et technologie
Volume 10, Numéro 1, Pages 117-125
2012-01-01
Authors : Karoui S. .
Abstract: The radiations in space environment with can induce failures disturbing the functionalities of the space applications embedded VLSI circuit. None means of prevention provide a total immunity. A solution consists to study and predict the sensitivity of components to be used in such applications, with an aim of choosing the least sensitive circuits. The objective of this work is to present
Space environment / Heavy Ions / Upset / SEP Phenomenon / Functional Testers.
كرور زهير
.
ص 268-284.
Wadie Bachir Bouiadjra Bouiadjra
.
pages 93-101.
Namoune Abdelhadi
.
Taleb Rachid
.
Belboula Abdelkader
.
Chabni Fayçal
.
pages 560-567.