Journal of Scientific Research
Volume 1, Numéro 1, Pages 3-9
2011-06-01
Microstructural Analysis Of Screen Printed Tio2 Thick Films
Authors : Dighavkar C. G. . Patil A. V. . Shinde U.p. . Borse R. Y. .
Abstract
In this paper, we explore for the first time the compositional, morphological and structural properties of TiO2 thick films prepared by a standard screen printing method and fired between 600oC to 1000oC for 2-hours in an air atmosphere. Morphological, compositional, structural properties of the samples were analyzed by scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction. X-ray diffraction shows that films are a mixture of anatase and rutile structures. During firing there was a phase transformation and at 1000 ºC the anatase phase disappeared and only rutile phase was found. Scanning electron microscopy shows that the grain size increases as the firing temperature increases. From X-ray diffraction patterns the texture coefficients of (hkl) planes were evaluated which shows good crystallinity for high temperature. The crystallite size changes from 12.08 to 36.42. nm with respect to the increase in firing temperature. The dislocation density, stacking fault probability and RMS microstrain of the film were found to decrease with the firing temperature.
Keywords
TiO2; screen printing; thick films; firing; crystallinity
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